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 2SK1526, 2SK1527
Silicon N-Channel MOS FET
November 1996 Application
High speed power switching
Features
* * * * * Low on-resistance High speed switching Low drive current No secondary breakdown Suitable for switching regulator and DC-DC converter
Outline
TO-3PL
D G
1
2
3
S
1. Gate 2. Drain 3. Source
2SK1526, 2SK1527
Absolute Maximum Ratings (Ta = 25C)
Item Drain to source voltage 2SK1526 2SK1527 Gate to source voltage Drain current Drain peak current Body to drain diode reverse drain current Channel dissipation Channel temperature Storage temperature Note 1. PW 10 s, duty cycle 1% 2. Value at TC = 25C VGSS ID ID(pulse)* IDR Pch* Tch Tstg
2 1
Symbol VDSS
Ratings 450 500 30 40 160 40 250 150 -55 to +150
Unit V
V A A A W C C
2
2SK1526, 2SK1527
Electrical Characteristics (Ta = 25C)
Item Drain to source breakdown voltage Symbol Min 2SK1526 V(BR)DSS 2SK1527 V(BR)GSS IGSS 450 500 30 -- -- -- -- -- -- 10 250 V A A V S pF pF pF ns ns ns ns V ns IF = 40 A, VGS = 0 IF = 40 A, VGS = 0, diF/dt = 100 A/s ID = 20 A, VGS = 10 V, RL = 1.5 IG = 100 A, VDS = 0 VGS = 25 V, VDS = 0 VDS = 360 V, VGS = 0 VDS = 400 V, VGS = 0 VGS(off) 2.0 -- -- |yfs| Ciss Coss Crss td(on) tr td(off) tf VDF trr 20 -- -- -- -- -- -- -- -- -- -- 0.11 0.12 30 5800 1430 150 60 175 420 160 1.2 600 3.0 0.15 0.16 -- -- -- -- -- -- -- -- -- -- ID = 20 A, VDS = 10 V * VDS = 10 V, VGS = 0, f = 1 MHz
1
Typ --
Max --
Unit V
Test conditions ID = 10 mA, VGS = 0
Gate to source breakdown voltage Gate to source leak current Zero gate voltage drain current
2SK1526 IDSS 2SK1527
Gate to source cutoff voltage
ID = 1 mA, VDS = 10 V ID = 20 A, VGS = 10 V *
1
Static Drain to source 2SK1526 RDS(on) on state resistance 2SK1527 Forward transfer admittance Input capacitance Output capacitance Reverse transfer capacitance Turn-on delay time Rise time Turn-off delay time Fall time Body to drain diode forward voltage Body to drain diode reverse recovery time Note 1. Pulse test
3
2SK1526, 2SK1527
Power vs. Temperature Derating 300
Channel Dissipation Pch (W)
Maximum Safe Operation Area 1,000 300 Drain Current ID (A) 100 30 10 3 1 0.3 0.1 1
200
100
a are his (on) t 10 in DS 10 s ion y R 0 rat ted b s e PW Op limi 1m DC = is s 10 Op m er s( ati 1 on Sh (T ot ) C= 25 C )
Ta = 25C 2SK1526 2SK1527
0
50 100 Ambient Temperature Ta (C)
150
3 30 10 100 300 1,000 Drain to Source Voltage VDS (V)
Typical Output Characteristics 50 10 V 6V
Typical Transfer Characteristics 50 VDS = 10 V Pulse Test
Pulse Test 5V
Drain Current ID (A)
40
40
Drain Current ID (A)
30 4.5 V 20
30 Ta = 75C 25C -25C
20
10
VGS = 4 V
10
0
8 4 12 16 Drain to Source Voltage VDS (V)
20
0
2 6 8 10 4 Gate to Source Voltage VGS (V)
4
2SK1526, 2SK1527
Drain to Source Saturation Voltage VDS (on) (V) Drain to Source Saturation Voltage vs. Gate to Source Voltage 10 Pulse Test ID = 50 A
Static Drain to Source on State Resistance vs. Drain Current Static Drain to Source on State Resistance RDS (on) () 5 2 1 0.5 Pulse Test
8
6
4 20 A 2 10 A
0.2 VGS = 10 V, 15 V 0.1 0.05 2 5 50 100 200 10 20 Drain Current ID (A)
0
2 6 8 4 Gate to Source Voltage VGS (V)
10
Static Drain to Source on State Resistance RDS (on) ()
Static Drain to Source on State Resistance vs. Temperature
Forward Transfer Admittance yfs (S)
Forward Transfer Admittance vs. Drain Current 100 50 VDS = 10 V Pulse Test TC = -25C 25C 75C
0.5 VGS = 10 V Pulse Test ID = 50 A 20 A
0.4
0.3
20 10 5
0.2
10 A
0.1
2 1 0.5
0 -40
0 80 120 40 Case Temperature TC (C)
160
1
5 20 2 10 Drain Current ID (A)
50
5
2SK1526, 2SK1527
Body to Drain Diode Reverse Recovery Time 5,000
Reverse Recovery Time t rr (ns)
Typical Capacitance vs. Drain to Source Voltage 10,000 Ciss
2,000 1,000 500
di/dt = 100 A/s, VGS = 0 Pulse Test
Capacitance C (pF)
1,000
Coss
200 100 50 1 2 5 20 50 10 Reverse Drain Current IDR (A) 100
100 Crss VGS = 0 f = 1 MHz 10 0 20 50 10 30 40 Drain to Source Voltage VDS (V)
Dynamic Input Characteristics 1,000 20
Switching Characteristics 1,000 Gate to Source Voltage VGS (V) 500 Switching Time t (ns) td (off)
Drain to Source Voltage VDS (V)
800
VDD = 100 V 250 V 400 V VGS VDS
ID = 30 A
16
200 100 50 tr
600
12
tf td (on)
400
8 VDD = 400 V 250 V 100 V 80 240 320 160 Gate Charge Qg (nc) 400
200
4
20 10 0.5
VGS = 10 V, PW = 2 s . duty < 1%, VDD = 30 V . 1 10 20 5 2 Drain Current ID (A) 50
0 0
6
2SK1526, 2SK1527
Reverse Drain Current vs. Sourse to Drain Voltage 50
Reverse Drain Current IDR (A)
Pulse Test 40
30
20 10 V VGS = 0, -5 V
10
0 0 2.0 0.4 0.8 1.6 1.2 Source to Drain Voltage VSD (V)
Normalized Transient Thermal Impedance S (t)
Normalized Transient Thermal Impedance vs. Pulse Width 3 TC = 25C 1 D=1 0.5 0.3 0.2
0.1
0.1
0.05
ch-c (t) = S (t) * ch-c ch-c = 0.5C/W, TC = 25C PDM C/W PW D = PW T
0.02
0.03
0.01 ulse ot P 1 Sh
T 100 1m 10 m Pulse Width PW (s) 100 m
0.01 10
1
10
Switching Time Test Circuit Vin Monitor
Waveforms 90%
Vout Monitor D.U.T
Vin 10% 10% 90% td (on) tr 90% td (off) 10%
RL
50 Vin 10 V VDD . = 30 V .
Vout
tf
7
2SK1526, 2SK1527
Notice
When using this document, keep the following in mind: 1. This document may, wholly or partially, be subject to change without notice. 2. All rights are reserved: No one is permitted to reproduce or duplicate, in any form, the whole or part of this document without Hitachi's permission. 3. Hitachi will not be held responsible for any damage to the user that may result from accidents or any other reasons during operation of the user's unit according to this document. 4. Circuitry and other examples described herein are meant merely to indicate the characteristics and performance of Hitachi's semiconductor products. Hitachi assumes no responsibility for any intellectual property claims or other problems that may result from applications based on the examples described herein. 5. No license is granted by implication or otherwise under any patents or other rights of any third party or Hitachi, Ltd. 6. MEDICAL APPLICATIONS: Hitachi's products are not authorized for use in MEDICAL APPLICATIONS without the written consent of the appropriate officer of Hitachi's sales company. Such use includes, but is not limited to, use in life support systems. Buyers of Hitachi's products are requested to notify the relevant Hitachi sales offices when planning to use the products in MEDICAL APPLICATIONS.
Hitachi, Ltd.
Semiconductor & IC Div. Nippon Bldg., 2-6-2, Ohte-machi, Chiyoda-ku, Tokyo 100, Japan Tel: Tokyo (03) 3270-2111 Fax: (03) 3270-5109 For further information write to: Hitachi America, Ltd. Semiconductor & IC Div. 2000 Sierra Point Parkway Brisbane, CA. 94005-1835 USA Tel: 415-589-8300 Fax: 415-583-4207
Hitachi Europe GmbH Electronic Components Group Continental Europe Dornacher Strae 3 D-85622 Feldkirchen Munchen Tel: 089-9 91 80-0 Fax: 089-9 29 30 00
Hitachi Europe Ltd. Electronic Components Div. Northern Europe Headquarters Whitebrook Park Lower Cookham Road Maidenhead Berkshire SL6 8YA United Kingdom Tel: 0628-585000 Fax: 0628-778322
Hitachi Asia Pte. Ltd. 16 Collyer Quay #20-00 Hitachi Tower Singapore 0104 Tel: 535-2100 Fax: 535-1533 Hitachi Asia (Hong Kong) Ltd. Unit 706, North Tower, World Finance Centre, Harbour City, Canton Road Tsim Sha Tsui, Kowloon Hong Kong Tel: 27359218 Fax: 27306071
8


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